Skip to search
Skip to main content
Search in
Keyword
Title (keyword)
Author (keyword)
Subject (keyword)
Title starts with
Subject (browse)
Author (browse)
Author (sorted by title)
Call number (browse)
search for
Search
Advanced Search
Bookmarks
(
0
)
Princeton University Library Catalog
Start over
Cite
Send
to
SMS
Email
EndNote
RefWorks
RIS
Printer
Bookmark
In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland
Format
Book
Language
English
Published/Created
[Place of publication not identified] SPIE 1999
Availability
Available Online
SPIE Digital Library Proceedings
Online Content
Details
Subject(s)
Integrated circuits
—
Very large scale integration
—
Design and construction
—
Congresses
[Browse]
Semiconductors
—
Design and construction
—
Congresses
[Browse]
Manufacturing processes
—
Materials
—
Congresses
[Browse]
Microelectronics
—
Congresses
[Browse]
Contributor
Amberiadis, Kostas
[Browse]
Content provider
Society of Photo Optical Instrumentation Engineers
[Browse]
European Optical Society
[Browse]
Institution of Electrical Engineers
[Browse]
Society of Photo-optical Instrumentation Engineers
[Browse]
European Commission
[Browse]
Scottish Enterprise
[Browse]
Series
Proceedings EurOpt series In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing
Notes
Bibliographic Level Mode of Issuance: Monograph
Language note
English
Statement on language in description
Princeton University Library aims to describe library materials in a manner that is respectful to the individuals and communities who create, use, and are represented in the collections we manage.
Read more...
Other views
Staff view
Ask a Question
Suggest a Correction
Report Harmful Language
Supplementary Information
Other versions
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing [electronic resource] : 19-21 May, 1999, Edinburgh, Scotland / Kostas Amberiadis ... [et al.], chairs/editors ; sponsored by EOS--European Optical Society, SPIE--the International Society for Optical Engineering, [and] Commission of the European Communities, Directorate General for Science, Research, and Development ; cosponsored by Scottish Enterprise [and] Sira Technology Centre (UK) ; cooperating organization, IEE--the Institution of Electrical Engineers.
id
9961141393506421
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland / Kostas Amberiadis [and others], chairs/editors ; sponsored by EOS--European Optical Society, SPIE--the International Society for Optical Engineering, [and] Commission of the European Communities, Directorate General for Science, Research, and Development ; cosponsored by Scottish Enterprise [and] Sira Technology Centre (UK) ; cooperating organization, IEE--the Institution of Electrical Engineers.
id
SCSB-3749465