1. Exoemission from processed solid surfaces and gas adsorption / Yoshihiro Momose. Momose, Yoshihiro [Browse] Gateway East, Singapore : Springer, [2023]©2023 Book No holdings available for this record
2. Photoelectron spectroscopy : bulk and surface electronic structures / Shigemasa Suga, Akira Sekiyama, Christian Tusche. Springer series in surface sciences ; Volume 72., Springer series in surface sciences ; Volume 72 Suga, Shigemasa [Browse] Cham, Switzerland : Springer, [2021]©2021 Book No holdings available for this record
3. Hydrogen and Hydrogen-Containing Molecules on Metal Surfaces [electronic resource] : Towards the Realization of Sustainable Hydrogen Economy / by Hideaki Kasai, Allan Abraham B. Padama, Bhume Chantaramolee, Ryan L. Arevalo. Kasai, Hideaki [Browse] Singapore : Springer Singapore : Imprint: Springer, 2020. Book No holdings available for this record
4. Surface Plasmon Resonance Sensors [electronic resource] : A Materials Guide to Design, Characterization, Optimization, and Usage / by Leiva Casemiro Oliveira, Antonio Marcus Nogueira Lima, Carsten Thirstrup, Helmut Franz Neff. Oliveira, Leiva Casemiro [Browse] Cham : Springer International Publishing : Imprint: Springer, 2019. Book No holdings available for this record
5. Atomic Scale Dynamics at Surfaces [electronic resource] : Theory and Experimental Studies with Helium Atom Scattering / by Giorgio Benedek, Jan Peter Toennies. Benedek, Giorgio [Browse] Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2018. Book No holdings available for this record
6. Confocal Raman Microscopy [electronic resource] / edited by Jan Toporski, Thomas Dieing, Olaf Hollricher. Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
7. Ellipsometry of Functional Organic Surfaces and Films [electronic resource] / edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
8. Kelvin Probe Force Microscopy [electronic resource] : From Single Charge Detection to Device Characterization / edited by Sascha Sadewasser, Thilo Glatzel. Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
9. Kelvin probe force microscopy : from single charge detection to device characterization / Sascha Sadewasser, Thilo Glatzel, editors. Springer series in surface sciences ; 65. Cham, Switzerland : Springer, [2018]©2018 Book Loading...Harold P. Furth Plasma Physics Library - Stacks » QH212.A78 K45 2018
10. Kinetics of Evaporation [electronic resource] / by Denis N. Gerasimov, Eugeny I. Yurin. Gerasimov, Denis N. [Browse] Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
11. Optical Characterization of Thin Solid Films [electronic resource] / edited by Olaf Stenzel, Miloslav Ohlídal. Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
12. Spin-Polarized Two-Electron Spectroscopy of Surfaces [electronic resource] / by Sergey Samarin, Oleg Artamonov, Jim Williams. Samarin, Sergey [Browse] Cham : Springer International Publishing : Imprint: Springer, 2018. Book No holdings available for this record
13. Electrodeposition of Nanostructured Materials [electronic resource] / by Farzad Nasirpouri. Nasirpouri, Farzad [Browse] Cham : Springer International Publishing : Imprint: Springer, 2017. Book No holdings available for this record
14. Electrodeposition of nanostructured materials / Farzad Nasirpouri. Springer series in surface sciences ; volume 62. Nasirpouri, Farzad [Browse] Cham : Springer, [2017]. Book Loading...Engineering Library - Stacks » QC176.84.S93 N36 2017
15. Hard X-ray Photoelectron Spectroscopy (HAXPES) [electronic resource] / edited by Joseph Woicik. Cham : Springer International Publishing : Imprint: Springer, 2016. Book No holdings available for this record
16. Ion Beam Modification of Solids [electronic resource] : Ion-Solid Interaction and Radiation Damage / edited by Werner Wesch, Elke Wendler. Cham : Springer International Publishing : Imprint: Springer, 2016. Book No holdings available for this record
17. Ion beam modification of solids : ion-solid interaction and radiation damage / Werner Wesch, Elke Wendler, editors. Springer series in surface sciences ; 61. Wesch, Werner [Browse] Switzerland : Springer, ©2016.Switzerland : Springer, 2016. Book Loading...Harold P. Furth Plasma Physics Library - Stacks » QC702.7.B65 W47 2016
18. Non-Classical Crystallization of Thin Films and Nanostructures in CVD and PVD Processes [electronic resource] / by Nong Moon Hwang. Hwang, Nong Moon [Browse] Dordrecht : Springer Netherlands : Imprint: Springer, 2016. Book No holdings available for this record
19. The Physics of Thin Film Optical Spectra [electronic resource] : An Introduction / by Olaf Stenzel. Stenzel, Olaf [Browse] Cham : Springer International Publishing : Imprint: Springer, 2016. Book No holdings available for this record
20. Defects at Oxide Surfaces [electronic resource] / edited by Jacques Jupille, Geoff Thornton. Cham : Springer International Publishing : Imprint: Springer, 2015. Book No holdings available for this record
