Princeton University Library Catalog

Computer Aided Testing of VLSI Wafers Using the Original Design Tools

Author/​Artist:
Norton, Charles D. [Browse]
Format:
Senior thesis
Language:
English
Advisor(s):
Dickinson, Bradley W. [Browse]
Department:
Princeton University. Department of Electrical Engineering [Browse]
Class year:
1988
Restrictions note:
This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu.