High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams.
language: en
creator: Adams, R. Dean
call number: JSE 02-2049
extent: xiii, 246 p. : ill. ; 25 cm.
format: Book
publisher: Boston : Kluwer Academic, c2003.
subject: Semiconductor storage devices—Testing
subject: Computer storage devices—Testing
author: Adams, R. Dean
created: 2003-01-01T00:00:00Z
date: 2003
location: ReCAP JSE 02-2049