High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams.

Author
Adams, R. Dean [Browse]
Format
Book
Language
English
Published/​Created
Boston : Kluwer Academic, c2003.
Description
xiii, 246 p. : ill. ; 25 cm.

Details

Subject(s)
Series
Frontiers in electronic testing [More in this series]
Bibliographic references
Includes bibliographical references (p. [229]-239) and index.
ISBN
1402072554 (alk. paper)
LCCN
2002034049
OCLC
50554142
RCP
N - S
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