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ICMTS 1996 : 1996 International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy / sponsored by the IEEE Electron Devices Society.
Author
IEEE International Conference on Microelectronic Test Structures (1996 : Trento, Italy)
[Browse]
Format
Book
Language
English
Published/Created
Piscataway, NJ : IEEE Service Center, c1996.
Description
xi, 313 p. : ill. ; 30 cm.
Availability
Available Online
IEEE Electronic Library (IEL)
Copies in the Library
Location
Call Number
Status
Location Service
Notes
ReCAP - Remote Storage
JSF 96-976
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Details
Subject(s)
Integrated circuits
—
Testing
—
Congresses
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Related name
IEEE Electron Devices Society
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Notes
"IEEE catalog number 96CH35832"--t. p. verso.
Bibliographic references
Includes bibliographical references and index.
Other title(s)
1996 International Conference on Microelectronic Test Structures
1996 IEEE International Conference on Microelectronic Test structures
ISBN
0780327837 (softbound)
0780327845 (casebound)
0780327853 (microfiche)
LCCN
95077997
OCLC
35633257
RCP
N - O
Statement on language in description
Princeton University Library aims to describe library materials in a manner that is respectful to the individuals and communities who create, use, and are represented in the collections we manage.
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Other versions
ICMTS 1996 : 1996 IEEE International Conference on Microelectronic Test Structures : March 25-28, 1996, Trento, Italy : proceedings / sponsored by the IEEE Electron Devices Society.
id
9910900513506421
1996 IEEE International Conference on Microelectronic Test Structures
id
99125287799906421