ICMTS 1996 : 1996 International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy / sponsored by the IEEE Electron Devices Society.

Author
IEEE International Conference on Microelectronic Test Structures (1996 : Trento, Italy) [Browse]
Format
Book
Language
English
Published/​Created
Piscataway, NJ : IEEE Service Center, c1996.
Description
xi, 313 p. : ill. ; 30 cm.

Availability

Copies in the Library

Location Call Number Status Location Service Notes
ReCAP - Remote StorageJSF 96-976 Browse related items Request

    Details

    Subject(s)
    Notes
    "IEEE catalog number 96CH35832"--t. p. verso.
    Bibliographic references
    Includes bibliographical references and index.
    Other title(s)
    • 1996 International Conference on Microelectronic Test Structures
    • 1996 IEEE International Conference on Microelectronic Test structures
    ISBN
    • 0780327837 (softbound)
    • 0780327845 (casebound)
    • 0780327853 (microfiche)
    LCCN
    95077997
    OCLC
    35633257
    RCP
    N - O
    Statement on language in description
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