Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.

Author
Siegel, Benjamin M. [Browse]
Format
Book
Language
English
Published/​Created
New York : Wiley, [1975]
Description
xiii, 474 p. : ill. ; 26 cm.

Details

Subject(s)
Related name
Notes
  • Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
  • "A Wiley biomedical-health publication."
Bibliographic references
Includes bibliographical references and index.
ISBN
0471790206
LCCN
74022483
OCLC
1085871
RCP
N - O
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