Wave-optical systems engineering II : 3-4 August, 2003, San Diego, USA / Frank Wyrowski, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.

Format
Book
Language
English
Published/​Created
Bellingham, Wash. : SPIE, [2003], ©2003.
Description
vii, 274 pages : illustrations ; 28 cm.

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    Details

    Subject(s)
    Related name
    Series
    • Proceedings of SPIE--the International Society for Optical Engineering ; v. 5182. [More in this series]
    • SPIE proceedings series, 0277-786X ; v. 5182
    Bibliographic references
    Includes bibliographical references and author index.
    Contents
    • Comments on wave-optical engineering / F. Wyrowski, H. Schimmel and S. Buhling
    • Use of ray tracing in wave-optical engineering / H. Schimmel, S. Buhling and F. Wyrowski
    • Local spherical interface approximation in the analysis of field propagation through modulated interfaces / H. Lajunen, J. Tervo, T. Vallius, J. Turunen and F. Wyrowski
    • Wave-optical engineering with VOL4 VirtualLab / S. Buhling, H. Schimmel and F. Wyrowski
    • Wigner optics and wave optics: fundamentals and practical applications / J. T. Sheridan, B. Hennelly and D. Kelly
    • Optical vortex trajectories through paraxial modal analysis / F. S. Roux
    • Propagation of electromagnetic fields between nonparallel planes / K. Matsushima, H. Schimmel, S. Buhling and F. Wyrowski
    • Wave-optical considerations in photolithography / A. K. Wong and C. Pierrat
    • Lithographic image simulation for the 21st century with 19th-century tools / R. L. Gordon and A. E. Rosenbluth
    • Mask and source optimization for lithographic imaging systems / A. Erdmann, R. Farkas, T. Fuhner, B. Tollkuhn and G. Kokai
    • Optimized visualization of phase objects with semiderivative real filters / A. Sagan, M. Kowalczyk and T. Szoplik
    • Point spread function engineering in confocal scanning microscopy / M. Martinez-Corral
    • Challenges in industrial applications of diffractive beam splitting / S. Buhling, H. Schimmel and F. Wyrowski
    • Polarization modulation by subwavelength-structured space-variant dielectric interfaces / J. Tervo and J. Turunen
    • Investigation of multimode dispersionless beams / V. S. Pavelyev, V. A. Soifer, M. R. Duparre and B. Luedge
    • Scaled optical Fourier transform: practical limitations / D. Kelly, J. T. Sheridan and W. T. Rhodes
    • Laser-mode engineering by generalized resonator concepts / U. D. Zeitner
    • Intracavity beamshaping in waveguide lasers / A. Buettner and U. D. Zeitner
    • Design for shaping, splitting, and diffusing light: a comparison / F. Wyrowski, H. Schimmel and S. Buhling
    • Wave-optical components for reconfigurable short-distance optical interconnects / L. Desmet, R. Buczynski, W. Grabowski, J. Van Erps, M. Vervaeke and H. Thienpont
    • Optical wave engineering for nanoscale surface metrology / J. Shamir, B. Spektor and Y. Parkhomenko
    • Optical scanning cryptography / T.-C. Poon
    • Design and experiments of planar optical light guides for virtual image displays / I. Gurwich, V. Weiss, L. Eisen, M. Meyklyar and A. A. Friesem
    • Diamond DOEs for focusing IR laser beams into pregiven focal domains / V. S. Pavelyev, V. A. Soifer, D. L. Golovashkin, V. V. Kononenko, V. I. Konov, S. M. Pimenov, M. R. Duparre and B. Luedge
    • Design and optimization considerations of multifocus phase-only diffractive elements / M. Skeren, I. Richter and P. Fiala
    • High-order Bessel beam generation using a Mach-Zehnder Interferometer / J. C. Gutierrez-Vega, C. Lopez-Mariscal and S. Chavez-Cerda
    • Phase diffractive filter to analyze an output step-index fiber beam / S. N. Khonina, R. V. Skidanov, V. V. Kotiyar, K. Jefimovs and J. Turunen
    • Characterization of thin films nonuniform in optical parameters by spectroscopic digital reflectometry / I. Ohlidal, M. Ohlidal, P. Klapetek, V. Cudek and M. Jakl.
    Other title(s)
    • Wave optical systems engineering II
    • Wave-optical systems engineering 2
    • Wave-optical systems engineering two
    ISBN
    0819450553
    OCLC
    54344347
    RCP
    C - S
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