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Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions / J.-M. Spaeth, H. Overhof.
Author
Spaeth, Johann-Martin
[Browse]
Format
Book
Language
English
Published/Created
Berlin ; New York : Springer, [2003], ©2003.
Description
xi, 490 pages : illustrations ; 24 cm.
Details
Subject(s)
Semiconductors
—
Defects
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Semiconductors
—
Testing
—
Methodology
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Nuclear magnetic resonance spectroscopy
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Related name
Overhof, H. (Harald), 1942-
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Series
Springer series in materials science ; v. 51.
[More in this series]
Springer series in materials science, 0933-033X ; 51
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Bibliographic references
Includes bibliographical references (p. [467]-484) and index.
ISBN
3540426957 (alk. paper)
LCCN
2002042592
OCLC
51022613
RCP
C - S
Statement on language in description
Princeton University Library aims to describe library materials in a manner that is respectful to the individuals and communities who create, use, and are represented in the collections we manage.
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Other versions
Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions / J.-M. Spaeth, H. Overhof.
id
SCSB-8719591