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The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.
Author
Terman, Lewis M. (Lewis Madison), 1877-1956
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Format
Book
Language
English
Published/Created
Boston : Houghton Mifflin Company, [1916], ©1916.
Description
xviii, 362 pages : illustrations ; 20 cm.
Availability
Copies in the Library
Location
Call Number
Status
Location Service
Notes
ReCAP - Remote Storage
150.72 T273
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Details
Subject(s)
Intelligence tests
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Binet-Simon Test
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Series
Riverside textbooks in education.
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Notes
Includes index.
Bibliographic references
"Selected references": p. [349]-356; "Suggestions for a teacher's private library on exceptional children": p. [357]-358.
Other title(s)
Binet-Simon intelligence scale.
LCCN
16014608
OCLC
186102
RCP
C - S
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The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.
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9914750673506421