Measuring intelligence : a guide to the administration of the new revised Stanford-Binet tests of intelligence / by Lewis M. Terman and Maud A. Merrill.

Author
Terman, Lewis M. (Lewis Madison), 1877-1956 [Browse]
Format
Book
Language
English
Published/​Created
Boston ; New York [etc.] : Houghton Mifflin company, [1937], [©1937]
Description
xi pages, 1 unnumbered page, 2 leaves, [3]-460 pages, 1 unnumbered page : including illustrations, tables, diagrams ; 21 cm.

Copies in the Library

Location Call Number Status
ReCAP - Remote Storage150.72 T27 Browse related items Request

    Details

    Subject(s)
    Author
    Series
    Riverside textbooks in education. [More in this series]
    Other title(s)
    Stanford-Binet tests for intelligence.
    LCCN
    37004449
    OCLC
    964301
    RCP
    C - S
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