Semiconductor measurements and instrumentation / W. R. Runyan.

Author
Runyan, W. R. [Browse]
Format
Book
Language
English
Published/​Created
New York : McGraw-Hill, [1975]
Description
vii, 280 pages : illustrations ; 26 cm.

Availability

Copies in the Library

Location Call Number Status Location Service Notes
ReCAP - Remote StorageQC611.24 .R86 Browse related items Request

    Details

    Subject(s)
    Series
    Texas Instruments electronics series. [More in this series]
    Bibliographic references
    Includes bibliographical references and index.
    ISBN
    0070542732
    LCCN
    75019035
    OCLC
    1504882
    RCP
    C - S
    Statement on language in description
    Princeton University Library aims to describe library materials in a manner that is respectful to the individuals and communities who create, use, and are represented in the collections we manage. Read more...