Total-reflection X-ray fluorescence analysis and related methods / Reinhold Klockenkamper, Alex von Bohlen, Leibniz-Institut für Analytische Wissenschaften, ISAS e.V., Dortmund and Berlin, Germany.

Author
Klockenkämper, Reinhold, 1937- [Browse]
Format
Book
Language
English
Εdition
Second edition.
Published/​Created
  • Hoboken, New Jersey : Wiley, [2015]
  • ©2015
Description
xvi, 519 pages : illustrations (some color) ; 25 cm.

Availability

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Lewis Library - Stacks QD96.X2 K58 2015 Browse related items Request

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    Summary note
    Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation Includes some 700 references for further study -- Provided by publisher.
    Notes
    Previous edition: 1997.
    Bibliographic references
    Includes bibliographical references and index.
    Contents
    • Fundamentals of x-ray fluorescence
    • Principles of total reflection XRF
    • Instrumentation for TXRF and GI-XRF
    • Performance of TXRF and GI-XRF analyses
    • Different fields of applications
    • Efficiency and evaluation
    • Trends and future prospects.
    ISBN
    • 9781118460276 (hbk.)
    • 1118460278 (hbk.)
    LCCN
    2014022279
    OCLC
    881407022
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