LEADER 02333cam a2200421Ia 4500001    9961216953506421
005    20200927154210.0
006    m        d
007    cr un|||||||||
008    031204s1999    waua    sb    101 0 eng d
035    (OCoLC)ocm53835896
035    (OCoLC)53835896
035    (NjP)6121695-princetondb
035     |z(NjP)Voyager6121695
035     |z(NjP)Voyager6121695
040    SPIED |cSPIED |dOCLCQ
050  4 TS156.2 |b.P65 1999
092 0  670.42/5 |221
245 00 Polarization and color techniques in industrial inspection |h[electronic resource] : |b17-18 June 1999, Munich, Germany / |cElzbieta A. Marszalec, Emanuele Trucco, chairs/editors ; sponsored by EOS--European Optical Society ... [et al.].
260    Bellingham, Wash., USA : |bSPIE, |cc1999.
300    ix, 314 p. : |bill. (some col.) ; |c28 cm.
490 1  Proceedings EurOpt series
490 1  SPIE proceedings series ; |vv. 3826
504    Includes bibliographical references and index.
530    Also available in print.
533    Electronic reproduction. |bBellingham, Wash. : |cSPIE--the International Society for Optical Engineering, |d2003. |nMode of access: World Wide Web. |nAccess restricted to SPIE Digital Library subscribers.
650  0 Automatic test equipment |vCongresses. |0http://id.loc.gov/authorities/subjects/sh2007101732
650  0 Polarization (Light) |xIndustrial applications |vCongresses.
650  0 Computer vision |xIndustrial applications |vCongresses. |0http://id.loc.gov/authorities/subjects/sh2009121257
650  0 Quality control |xOptical methods |vCongresses. |0http://id.loc.gov/authorities/subjects/sh2008122815
700 1  Marszalec, Elzbieta A. |0http://id.loc.gov/authorities/names/n93030456
700 1  Trucco, Emanuele. |0http://id.loc.gov/authorities/names/n98066423
710 2  European Optical Society. |0http://id.loc.gov/authorities/names/n92062713
710 2  Society of Photo-Optical Instrumentation Engineers. |0http://id.loc.gov/authorities/names/n78088934
730 0  SPIE digital library. |0http://id.loc.gov/authorities/names/no2006030688
776 1   |cOriginal |z0819433128 |w(DLC)   00699694 |w(OCoLC)42472579
830  0 Europto series
830  0 Proceedings of SPIE--the International Society for Optical Engineering ; |vv. 3826.
902    st14 |bx |6a |7m |dv |f0 |e20100511