Terrestrial neutron-induced soft errors in advanced memory devices / Takashi Nakamura ... [et al.].

Format
Book
Language
English
Published/​Created
Hackensack, NJ : World Scientific, c2008.
Description
xxii, 343 p. : ill. (some col.) ; 24 cm.

Details

Subject(s)
Related name
Bibliographic references
Includes bibliographical references (p. 291-315) and index.
Contents
Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
ISBN
  • 9789812778819
  • 9812778810
LCCN
2008298667
OCLC
185032763
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