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245 00 In-process optical metrology for precision machining : |b31 March-2 April 1987, the Hague, the Netherlands / |cPeter Langenbeck, chair/editor ; organized by ANRT--Association nationale de la recherche technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors, Comité Belge d'Optique ... [et al.].
260    Bellingham, Wash., USA : |bThe Society, |cc1987.
300    viii, 217 p. : |bill. ; |c28 cm.
490 1  Proceedings / SPIE ; |vv. 802
504    Includes bibliographies and index.
650  0 Optical measurements |vCongresses. |0http://id.loc.gov/authorities/subjects/sh2008108676
650  0 Interferometry |vCongresses. |0http://id.loc.gov/authorities/subjects/sh2008104275
700 1  Langenbeck, Peter. |0http://id.loc.gov/authorities/names/n87885420
710 2  Association nationale de la recherche technique. |0http://id.loc.gov/authorities/names/n50054575
710 2  Society of Photo-Optical Instrumentation Engineers. |0http://id.loc.gov/authorities/names/n78088934
710 2  Comité belge d'optique. |0http://id.loc.gov/authorities/names/nr88000882
830  0 Proceedings of SPIE--the International Society for Optical Engineering ; |vv. 802.
911    19921028
912    19900828000000.0
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