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CompTIA data+ DA0-001 / Akhil Behl, Siva G. Subramanian.
Author
Behl, Akhil
[Browse]
Format
Book
Language
English
Published/Created
[Indianapolis, Indiana] : Pearson Education, Inc., [2023]
Description
1 online resource (1 volume.) : illustrations
Availability
Available Online
O'Reilly Online Learning: Academic/Public Library Edition
Details
Subject(s)
Electronic data processing
—
Examinations
—
Study guides
[Browse]
Electronic data processing personnel
—
Certification
—
Examinations
—
Study guides
[Browse]
Computing Technology Industry Association
—
Examinations
—
Study guides
[Browse]
Author
Subramanian, Siva G.
[Browse]
Series
Exam cram (Pearson Education, Inc.)
[More in this series]
Exam CRAM
Summary note
CompTIA® Data+ DA0-001 Exam Cram is an all-inclusive study guide designed to help you pass the CompTIA Data+ DA0-001 exam. Prepare for test day success with complete coverage of exam objectives and topics, plus hundreds of realistic practice questions. Extensive prep tools include quizzes, Exam Alerts, and our essential last-minute review CramSheet. The powerful Pearson Test Prep practice software provides real-time assessment and feedback with two complete exams.
Notes
Includes index.
Source of description
OCLC-licensed vendor bibliographic record.
ISBN
9780137637362
0137637365
OCLC
1354541323
Statement on responsible collection description
Princeton University Library aims to describe library materials in a manner that is respectful to the individuals and communities who create, use, and are represented in the collections we manage.
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