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Princeton University Library Catalog
Scanning Probe Microscopy in Nanoscience and Nanotechnology [electronic resource] / edited by Bharat Bhushan.
1st ed. 2010.
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
1 online resource (973 p.)
NanoScience and Technology,
[More in this series]
NanoScience and Technology, 1434-4904
[More in this series]
NanoScience and Technology
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.
Description based on print version record.
Includes bibliographical references and index.
Scanning Probe Microscopy Techniques
Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids
Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy
Polarization-Sensitive Tip-Enhanced Raman Scattering
Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes
Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics
Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity
Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter
Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope
Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy
Simultaneous Topography and Recognition Imaging
Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM
Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules
Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices
Quantized Mechanics of Nanotubes and Bundles
Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials
Mechanical Properties of One-Dimensional Nanostructures
Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale
Controlling Wear on Nanoscale
Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping
Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture
Near-Field Optical Litography
A New AFM-Based Lithography Method: Thermochemical Nanolithography
Scanning Probe Alloying Nanolithography
Structuring the Surface of Crystallizable Polymers with an AFM Tip
Application of Contact Mode AFM to Manufacturing Processes
Scanning Probe Microscopy as a Tool Applied to Agriculture.
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