LEADER 01657cam a2200349 i 4500001    99125326542906421
005    20231011225400.0
006    m     o  d
007    cr#|||||||||||
008    181117s1987    waua    o     100 0 eng d
035    (CKB)3460000000119847
035    (WaSeSS)IndRDA00107116
035    (EXLCZ)993460000000119847
040    WaSeSS |beng |erda |cWaSeSS
050  4 TJ1180 |b.I57 1987
082 04 671.35 |223
111 2  International Symposium on Optical and Optoelectronic Applied Sciences and Engineering |n(4th : |d1987 : |cHague, Netherlands)
245 10 In-process optical metrology for precision machining : |bfourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering : 30 March-3 April 1987, The Hague, Netherlands / |ceditor, Peter Langenbeck ; sponsored by SPIE.
264  1 Bellingham, Wash. : |bSPIE, |c1987.
300    1 online resource (viii, 217 pages) : |billustrations.
336    text |btxt |2rdacontent
337    computer |bc |2rdamedia
338    online resource |bcr |2rdacarrier
490 1  Proceedings of SPIE
588    Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 13, 2018).
650  0 Machining |vCongresses.
650  0 Optical measurements |vCongresses.
776 0   |z0-89252-837-0
700 1  Langenbeck, Peter, |eeditor.
710 2  Society of Photo-optical Instrumentation Engineers, |esponsoring body.
711 2  International Symposium on Optical and Optoelectronic Applied Sciences and Engineering.
830  0 Proceedings of SPIE--the International Society for Optical Engineering ; |v802.
906    BOOK