In-process optical metrology for precision machining : fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering : 30 March-3 April 1987, The Hague, Netherlands / editor, Peter Langenbeck ; sponsored by SPIE.

Author
International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (4th : 1987 : Hague, Netherlands) [Browse]
Format
Book
Language
English
Published/​Created
Bellingham, Wash. : SPIE, 1987.
Description
1 online resource (viii, 217 pages) : illustrations.

Available Online

Details

Subject(s)
Editor
Sponsoring body
Related name
Series
  • Proceedings of SPIE--the International Society for Optical Engineering ; 802. [More in this series]
  • Proceedings of SPIE
Source of description
Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 13, 2018).
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