Details

Subject(s)

• Materials—Texture [Browse]
• Materials—Analysis [Browse]

Summary note

The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to.

Notes

Description based upon print version of record.

Bibliographic references

Includes bibliographical references and index.

Source of description

OCLC-licensed vendor bibliographic record.

Language note

English

Contents

• Front cover; Contents; Preface; Authors; Part I: Fundamentals Issues; Chapter 1. Introduction; Chapter 2. Descriptors of Orientation; Chpater 3. Application of Diffraction to Texture Analysis; Part II: Macrotexture Analysis; Chapter 4. Macrotexture Measurements; Chapter 5. Evaluation and Representation of Macrotexture Data; Part III: Microtexture Analysis; Chapter 6. The Kiruchi Diffraction Pattern; Chapter 7. Scanning Electron Microscopy-Based Techniques; Chapter 8. Transmission Electron Micrscopy-Based Techniques; Chapter 9. Evaluation and Representation of Microtexture Data
• Chapter 10. Orientation Microscopy and Orientation MappingChapter 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity; Chapter 12. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods; Appendices; Appendix I; Appendix II; Appendix III; Appendix IV; Appendix V; Appendix VI; Appendix VII; Glossary; References; General Bibliography; Index; Back cover

ISBN

• 0-429-19190-1
• 1-282-33615-0
• 9786612336157
• 1-4200-6366-9

OCLC

• 664233729
• 1066118119

International Article Number

• 9781138410220

Statement on language in description

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