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Princeton University Library Catalog
1996 IEEE International Conference on Microelectronic Test Structures
IEEE, Electron Devices Society Staff
[Place of publication not identified] IEEE 1996
Bibliographic Level Mode of Issuance: Monograph
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ICMTS 1996 : 1996 IEEE International Conference on Microelectronic Test Structures : March 25-28, 1996, Trento, Italy : proceedings / sponsored by the IEEE Electron Devices Society.
ICMTS 1996 : 1996 International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy / sponsored by the IEEE Electron Devices Society.