2008 IEEE International Test Conference

Corporate author
IEEE Staff [Browse]
Format
Book
Language
English
Published/​Created
[Place of publication not identified] I E E E 2008

Details

Contributor
Subseries of
Test Conference, IEEE International
Notes
Bibliographic Level Mode of Issuance: Monograph
Language note
English
ISBN
  • 1-5090-7813-4
  • 1-4244-2403-8
Statement on language in description
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Other views
Staff view

Supplementary Information