Testing for small-delay defects in nanoscale CMOS integrated circuitsGoel, Sandeep K.Chakrabarty, KrishnenduEnglishBookAdvances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing2014Boca Raton : CRC Press, 2014.Metal oxide semiconductors, Complementary—TestingBook97813152178199781439829417