Testing for small-delay defects in nanoscale CMOS integrated circuits - Goel, Sandeep K.; Chakrabarty, Krishnendu (Boca Raton : CRC Press, 2014)
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing
section I. Timing-aware ATPG -- section II. Faster-than-at-speed -- section III. Alternative methods -- section Ivolume SDD metrics.
Description based upon print version of record.
Includes bibliographical references.
English
Description based on print version record.
Keywords: Metal oxide semiconductors, Complementary -- Testing