MET 2017 : 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing : proceedings : 22 May 2017, Buenos Aires, Argentina / sponsors, IEEE Computer Society, Association for Computing Machinery.

Format
Book
Language
English
Published/​Created
Piscataway, New Jersey : IEEE Press, 2017.
Description
1 online resource (56 pages)

Details

Subject(s)
Sponsoring body
Notes
Includes index.
Source of description
Description based on: online resource; title from pdf title page (ACM Digital Library, viewed August 21, 2018).
ISBN
1-5386-0424-8
Statement on language in description
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Supplementary Information