<oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Semiconductor devices in harsh conditions</dc:title><dc:creator>Chrzanowska-Jeske, Malgorzata</dc:creator><dc:creator>Weide-Zaage, Kirsten</dc:creator><dc:language>English</dc:language><dc:format>Book</dc:format><dc:description>The book focuses on radiation, operating conditions, sensor systems, and package and system design.</dc:description><dc:date>2017</dc:date><dc:publisher>Boca Raton : CRC Press, [2017]</dc:publisher><dc:publisher>©2017</dc:publisher><dc:subject>Semiconductors—Reliability</dc:subject><dc:subject>Extreme environments</dc:subject><dc:subject>Environmental testing</dc:subject><dc:type>Book</dc:type><dc:identifier>9781315351940</dc:identifier><dc:identifier>9781315368948</dc:identifier><dc:identifier>9781498743822</dc:identifier></oai_dc:dc>