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008    180706t20172017fluad   ob    001 0 eng d
020    1-315-35194-3
020    1-315-36894-3
020    1-4987-4382-X
020    9781315368948
024 7  10.1201/9781315368948 |2doi
035    (CKB)3710000000960827
035    (MiAaPQ)EBC4748374
035    (OCoLC)966358842
035    (FlBoTFG)9781315368948
035    (EXLCZ)993710000000960827
040    FlBoTFG |cFlBoTFG |erda
050  4 TK7871.85 |b.S465 2017
082 0  621.3815/2 |223
245 00 Semiconductor devices in harsh conditions / |cedited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
250    1st ed.
264  1 Boca Raton : |bCRC Press, |c[2017]
264  4  |c©2017
300    1 online resource (257 pages).
336    text |2rdacontent
337    computer |2rdamedia
338    online resource |2rdacarrier
490 1  Devices, Circuits, and Systems
504    Includes bibliographical references at the end of each chapters and index.
505 0  section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.
520    The book focuses on radiation, operating conditions, sensor systems, and package and system design.
588    Description based on print version record.
650  0 Semiconductors |xReliability.
650  0 Extreme environments.
650  0 Environmental testing.
700 1  Chrzanowska-Jeske, Malgorzata, |eeditor.
700 1  Weide-Zaage, Kirsten, |eeditor.
776 08  |z1-4987-4380-3
830  0 Devices, circuits, and systems.
906    BOOK