VTS 2008 : proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April - 1 May 2008.

Author
IEEE VLSI Test Symposium (26th : 2008 : San Diego, Calif.) [Browse]
Format
Book
Language
English
Published/​Created
New York : IEEE, 2008.
Description
1 online resource (xxx, 413 pages)

Details

Subject(s)
Integrated circuitsVery large scale integrationTestingCongresses [Browse]
Subseries of
VLSI Test Symposium
Source of description
Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 17, 2018).
ISBN
1-5090-8176-3
Statement on language in description
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Supplementary Information