Manufacturing yield evaluation of VLSI/WSI systems / [edited by Bruno Ciciani].

Format
Book
Language
English
Published/​Created
Los Alamitos, CA : IEEE Computer Society Press, 1995.
Description
x, 437 p. : ill. ; 28 cm.

Details

Subject(s)
Related name
Bibliographic references
Includes bibliographical references.
ISBN
  • 0818662905 (paper)
  • 0818662913 (M/fiche)
  • 0818662921 (case)
LCCN
94020185
OCLC
34971155
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