Princeton University Library Catalog

ICMTS 95 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan / sponsored by the IEEE Electron Devices Society.

Author:
IEEE International Conference on Microelectronic Test Structures (1995 : Nara-shi, Japan) [Browse]
Format:
Book
Language:
English
Published/​Created:
Piscataway, NJ : IEEE Service Center, c1995.
Description:
xii, 302 p. : ill. ; 28 cm.
Notes:
"IEEE Catalog Number 95CH3480-1."
Bibliographic references:
Includes bibliographical references and index.
Subject(s):
Integrated circuitsTestingCongresses [Browse]
Other title(s):
1995 IEEE International Conference on Microelectronic Test Structures
ISBN:
  • 0780320654 (pbk)
  • 0780320662 (case)
  • 0780320670 (microfiche)
LCCN:
94077700
OCLC:
32830039
Related name:
Other views:
Staff view