Integrating photogrammetric techniques with scene analysis and machine vision II : 19-21 April 1995, Orlando, Florida / David M. McKeown, Ian J. Dowman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.

Format
Book
Language
English
Published/​Created
Bellingham, Wash. : SPIE, ©1995.
Description
vii, 300 pages : illustrations ; 28 cm.

Availability

Copies in the Library

Location Call Number Status Location Service Notes
ReCAP - Remote StorageTA1634 .I552 1995 Browse related items Request

    Details

    Subject(s)
    Series
    • Proceedings of SPIE--the International Society for Optical Engineering ; v. 2486. [More in this series]
    • Proceedings / SPIE--the International Society for optical Engineering ; v. 2486
    Bibliographic references
    Includes bibliographic references and author index.
    Contents
    • Mathematical models and analysis
    • Automated registration
    • Generation of digital elevation models
    • Implementational and operational use
    • Cartography for advanced distribution simulation
    • Automated extraction of cultural features.
    ISBN
    • 0819418390 ((paperback))
    • 9780819418395 ((paperback))
    LCCN
    94074669
    OCLC
    32933272
    Statement on language in description
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