Princeton University Library Catalog

Robust speckle metrology techniques for stress analysis and NDT / Matias R. Viotti and Armando Albertazzi, Jr.

Author:
Viotti, Matias R. [Browse]
Format:
Book
Language:
English
Published/​Created:
Bellingham, Washington : SPIE, 2014.
Description:
1 online resource (xiii, 176 pages) : illustrations.
Series:
SPIE Press monograph ; PM251. [More in this series]
Summary note:
Optical techniques are usually applied inside laboratories equipped with temperature, humidity and vibration control. These techniques are very suitable for fast measurements due to their noncontact nature and their capability to measure on surfaces without special, time-consuming preparation. Among them, optical methods based on the speckle phenomenon have developed substantially over the last two decades due to the development of digital image processing, digital cameras, computers, lasers, and optical components. However, applying speckle methods outside of the laboratory becomes a challenging task. This book presents techniques and tools that will enable the development of robust measurement instruments to be used outside the laboratory for nondestructive structural-integrity-evaluation devices. Additionally, several technical solutions that combine mechanical systems to solve industrial measurement demands are described.
Bibliographic references:
Includes bibliographical references.
Contents:
Preface -- List of symbols and notation -- 1. NDT applications in engineering -- 2. Principles of digital speckle pattern interferometry -- 3. Optical configurations for measurements using DSPI -- 4. Robust optical systems -- 5. Quantitative evaluation of stresses and strains -- 6. Quantitative evaluation of residual stresses -- 7. Qualitative fault detection and evaluation -- 8. Digital image correlation for structural monitoring -- 9. Closing remarks.
Subject(s):
ISBN:
  • 9781628413199 ((electronic bk.))
  • 1628413190 ((electronic bk.))
  • 1628413182
  • 9781628413182
  • ((print))
Doi:
  • 10.1117/3.1002651
Author:
Publisher:
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